Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9703919 | System and method of filtering actual defects from defect information for a wafer | Tsung-Hsien Lee | 2017-07-11 |
MH
Min-Hsin Hsieh
Overall (2017): #308,230 of 506,227Top 65%
1
Patents 2017