Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9804220 | Device testing and monitoring method thereof | Jaw-Juinn Horng, Szu-Lin Liu | 2017-10-31 |
| 9768762 | Integrated circuit and method of testing | — | 2017-09-19 |
| 9680486 | DCO phase noise with PVT-insensitive calibration circuit in ADPLL applications | Feng-Wei Kuo, Kuang-Kai Yen, Chewn-Pu Jou, Robert Bogdan Staszewski | 2017-06-13 |