Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9844778 | Testing module and method for testing test sample | Yi-An Shih, Cheng-Chang Lai | 2017-12-19 |
| 9656855 | Semiconductor structure and manufacturing method thereof | Li-Chen Yen, Tzu-Heng Wu, Yi Heng Tsai, Chun-Ren Cheng | 2017-05-23 |