Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9748112 | Quality evaluation method for silicon wafer, and silicon wafer and method of producing silicon wafer using the method | Toshiaki Ono | 2017-08-29 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9748112 | Quality evaluation method for silicon wafer, and silicon wafer and method of producing silicon wafer using the method | Toshiaki Ono | 2017-08-29 |