Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9817065 | Test mode circuit and semiconductor device including the same | Tae Seung Shin | 2017-11-14 |
| 9558829 | System having a semiconductor integrated circuit device | — | 2017-01-31 |