Issued Patents 2017
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9823203 | X-ray surface analysis and measurement apparatus | Sylvia Jia Yun Lewis, Janos Kirz | 2017-11-21 |
| 9719947 | X-ray interferometric imaging system | Sylvia Jia Yun Lewis, Janos Kirz | 2017-08-01 |
| 9594036 | X-ray surface analysis and measurement apparatus | Sylvia Jia Yun Lewis, Janos Kirz | 2017-03-14 |
| 9570265 | X-ray fluorescence system with high flux and high flux density | Sylvia Jia Yun Lewis, Janos Kirz | 2017-02-14 |
| 9543109 | X-ray sources using linear accumulation | Sylvia Jia Yun Lewis, Janos Kirz, Alan Francis Lyon | 2017-01-10 |