Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9780006 | Method for evaluating SOI substrate | — | 2017-10-03 |
| 9748151 | Method for evaluating semiconductor substrate | Hiroshi Takeno | 2017-08-29 |
| 9696368 | Semiconductor substrate evaluating method, semiconductor substrate for evaluation, and semiconductor device | — | 2017-07-04 |