Issued Patents 2017
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9721817 | Apparatus for measuring impurities on wafer and method of measuring impurities on wafer | — | 2017-08-01 |
| 9626314 | Method and apparatus for allocating interruptions | Byoung Ik KANG, Joong Baik Kim | 2017-04-18 |
| 9607419 | Method of fitting virtual item using human body model and system for providing fitting service of virtual item | Ho Won Kim, Ki-Nam Kim, Jin Sung Choi, Bon Ki Koo, Kyu-Sung CHO +3 more | 2017-03-28 |
| 9608024 | CMOS image sensor for reducing dead zone | Yi-Tae Kim, Jong Eun Park, Jung-Chak Ahn, Kyung Ho Lee, Tae Hun Lee +1 more | 2017-03-28 |
| 9609250 | Unit pixels for image sensors and pixel arrays comprising the same | Yi-Tae Kim, Jung-Chak Ahn, Young Woo Jung | 2017-03-28 |