Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678020 | Apparatus and method for inspection of substrate defect | Woo-Seok Ko, Ji-Young Shin, Seong Jin YUN, Yu-Sin Yang, Sang-Kil Lee +1 more | 2017-06-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678020 | Apparatus and method for inspection of substrate defect | Woo-Seok Ko, Ji-Young Shin, Seong Jin YUN, Yu-Sin Yang, Sang-Kil Lee +1 more | 2017-06-13 |