Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9632126 | Circuit of measuring leakage current in a semiconductor integrated circuit | Kun-Yong Yoon, Jae-Jin Park | 2017-04-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9632126 | Circuit of measuring leakage current in a semiconductor integrated circuit | Kun-Yong Yoon, Jae-Jin Park | 2017-04-25 |