Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9747998 | Test method of semiconductor memory device and semiconductor memory system transferring fail address data from a volatile to a non-volatile memory array using an error-correction code engine | Sua Kim, Dongsoo Kang, Chulwoo Park, Jun Hee Yoo, Hak-Soo Yu +3 more | 2017-08-29 |