Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9753086 | Scan flip-flop and scan test circuit including the same | Ha-Young Kim, SUNG-WEE CHO, Dal-Hee Lee | 2017-09-05 |
| 9571076 | Bidirectional delay circuit and integrated circuit including the same | Jae-Woo Seo, Sung Hyun Park, Woo-Jin Rim, Ha-Young Kim, Yong Ho Kim | 2017-02-14 |