Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9831137 | Defect imaging apparatus, defect detection system having the same, and method of detecting defects using the same | Il-Suk PARK | 2017-11-28 |
| 9727799 | Method of automatic defect classification | Il-Suk PARK, Jeong-Ho Ahn | 2017-08-08 |