Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9761501 | Method of manufacturing a semiconductor device and inspecting an electrical characteristic thereof using socket terminals | Toshitsugu Ishii, Naohiro Makihira, Hidekazu Iwasaki | 2017-09-12 |