Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9632206 | X-ray inspection system that integrates manifest data with imaging/detection processing | Shehul Sailesh Parikh, Balamurugan Sankaranarayaran, Jeffrey Bryan Abel, Joseph Bendahan | 2017-04-25 |