DS

David Jack Savage

QM Quest Metrology: 1 patents #1 of 5Top 20%
📍 Renton, WA: #74 of 190 inventorsTop 40%
🗺 Washington: #4,569 of 12,901 inventorsTop 40%
Overall (2017): #445,320 of 506,227Top 90%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9638517 Optical thread profiler Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz 2017-05-02