YW

Yi-Ju Wang

TSMC: 1 patents #1,425 of 2,832Top 55%
📍 New Taipei, TW: #700 of 2,136 inventorsTop 35%
Overall (2017): #188,948 of 506,227Top 40%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9793183 System and method for measuring and improving overlay using electronic microscopic imaging and digital processing Cheng-Ming Ho, Po Shun Lin, Venkata Sripathi Sasanka Pratapa 2017-10-17