Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9691669 | Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologies | Sharad Saxena, Thomas Brozek, Yuan Yu, Mike Kyu Hyon Pak | 2017-06-27 |