Issued Patents 2017
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9797926 | Contact and electrical connection testing apparatus using the same | Takahiro Sakai | 2017-10-24 |
| 9797925 | Probe pin and electronic device using the same | Takahiro Sakai | 2017-10-24 |
| D794480 | Probe pin | Takahiro Sakai, Makoto Kondo | 2017-08-15 |
| D792793 | Probe pin | Takahiro Sakai, Makoto Kondo | 2017-07-25 |
| D792253 | Probe pin | Takahiro Sakai, Makoto Kondo | 2017-07-18 |
| D792256 | Probe pin | Takahiro Sakai, Makoto Kondo | 2017-07-18 |
| D792255 | Probe pin | Takahiro Sakai, Makoto Kondo | 2017-07-18 |
| D792254 | Probe pin | Takahiro Sakai, Makoto Kondo | 2017-07-18 |
| D789224 | Probe pin | Takahiro Sakai | 2017-06-13 |
| D789223 | Probe pin | Takahiro Sakai | 2017-06-13 |
| D789225 | Probe pin | Takahiro Sakai | 2017-06-13 |
| D788616 | Probe pin | Takahiro Sakai | 2017-06-06 |
| D788615 | Probe pin | Takahiro Sakai | 2017-06-06 |
| 9598784 | Electroformed component production method | Yoshinobu Hemmi, Takahiro Sakai, Hideaki Ozaki | 2017-03-21 |
| 9595773 | Probe pin having a first plunger with a guide projection slidingly movable in a guide slot of a second plunger | Yoshinobu Hemmi, Takahiro Sakai | 2017-03-14 |
| 9590346 | Connecting mechanism having two contacts with contact surfaces inclined in a direction perpendicular to their mating direction | Yoshinobu Hemmi, Takahiro Sakai, Yuki Kotake | 2017-03-07 |
| D776551 | Probe pin | Takahiro Sakai | 2017-01-17 |
| D776552 | Probe pin | Takahiro Sakai | 2017-01-17 |
| D775984 | Probe pin | Takahiro Sakai | 2017-01-10 |