NY

Naoki Yoshinaga

NE Nec: 2 patents #170 of 890Top 20%
Overall (2017): #119,842 of 506,227Top 25%
2
Patents 2017

Issued Patents 2017

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9658916 System analysis device, system analysis method and system analysis program Masanao Natsumeda 2017-05-23
9601010 Assessment device, assessment system, assessment method, and computer-readable storage medium Satoko Itaya, Peter Davis, Rie Tanaka, Taku Konishi, Shinichi Doi 2017-03-21