Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9804053 | Defect analysis device, defect analysis method, and program | Masatake Takahashi, Yasuhiro Sasaki | 2017-10-31 |
| 9759629 | Leak detection device, leak detection method and program | Masatake Takahashi | 2017-09-12 |