Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9778166 | Microparticle measurement device | — | 2017-10-03 |
| 9551670 | Surface inspection apparatus and method thereof | Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake, Yukio Kenbou +2 more | 2017-01-24 |