YJ

You Jiang

NC National Institute Of Metrology, China: 1 patents #1 of 9Top 15%
Overall (2017): #90,747 of 506,227Top 20%
2
Patents 2017

Issued Patents 2017

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9679759 Type rectangular ion trap device and method for ion storage and separation Xingchuang Xiong, Zejian Huang, Xiang Fang 2017-06-13
9646617 Method and device of extracting sound source acoustic image body in 3D space Liping Huang, Heng Wang 2017-05-09