AB

Andrzej Buczkowski

NI Nanometrics Incorporated: 1 patents #1 of 6Top 20%
📍 Elmhurst, NY: #3 of 13 inventorsTop 25%
🗺 New York: #4,556 of 12,278 inventorsTop 40%
Overall (2017): #493,138 of 506,227Top 100%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9846122 Optical metrology system for spectral imaging of a sample Mikhail Sluch 2017-12-19