Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9835651 | Cantilever type probe card for high frequency signal transmission | Wei-Cheng Ku, Jun-Liang Lai, Chih-Hao Ho | 2017-12-05 |
| 9759743 | Testing system and method for testing of electrical connections | Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang | 2017-09-12 |
| 9759746 | Probe module | Wei-Cheng Ku, Shin-Lan Kao | 2017-09-12 |
| 9645197 | Method of operating testing system | Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang | 2017-05-09 |
| 9581676 | Method of calibrating and debugging testing system | Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang | 2017-02-28 |