Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9830694 | Multi-level image focus using a tunable lens in a machine vision inspection system | — | 2017-11-28 |
| 9774765 | Chromatic aberration correction in imaging system including variable focal length lens | Mark Lawrence Delaney | 2017-09-26 |
| 9740190 | Method for programming a three-dimensional workpiece scan path for a metrology system | — | 2017-08-22 |
| 9736355 | Phase difference calibration in a variable focal length lens system | — | 2017-08-15 |
| 9726876 | Machine vision inspection system and method for obtaining an image with an extended depth of field | — | 2017-08-08 |