FN

Frans de Nooij

MI Mitutoyo: 1 patents #34 of 106Top 35%
Overall (2017): #423,486 of 506,227Top 85%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9568304 Image sequence and evaluation method and system for structured illumination microscopy Han Haitjema, Lukasz Redlarski 2017-02-14