Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9810738 | Semiconductor device, diagnostic test, and diagnostic test circuit | Yukitoshi Tsuboi, Hiroshi Nagaoka, Yusuke Matsunaga, Yutaka Igaku, Naotaka Kubota | 2017-11-07 |
| 9647693 | Data processing apparatus | Yukitoshi Tsuboi | 2017-05-09 |