Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9658947 | Method for ranking fault-test pairs based on waveform statistics in a mutation-based test program evaluation system | Tien-Chun Wei, Jean-Marc A. Forey, Kai Yang, Kuo-Ching Lin | 2017-05-23 |