Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9535120 | Integrated circuit and method for establishing scan test architecture in integrated circuit | Jianguo REN, Chong Dai, Fengguo Gao, Shang-Bin Huang | 2017-01-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9535120 | Integrated circuit and method for establishing scan test architecture in integrated circuit | Jianguo REN, Chong Dai, Fengguo Gao, Shang-Bin Huang | 2017-01-03 |