Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9728273 | Embedded memory testing using back-to-back write/read operations | Naveen Purushotham | 2017-08-08 |
| 9618579 | Programmable circuits for correcting scan-test circuitry defects in integrated circuit designs | — | 2017-04-11 |