Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9779167 | Management system for skin condition measurement analysis information and management method for skin condition measurement analysis information | Fumie Kusumoto, Masashi Yoshimura, Eiji Sakata, Kenji Matsuoka, Kengo Miura | 2017-10-03 |