Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9810641 | Systems and methods for measuring physical characteristics of semiconductor device elements using structured light | Deepak Sood, Zhijie Wang, Thomas J. Colosimo, JR., Shu-Guo Tang | 2017-11-07 |