JL

Jhinhwan Lee

KAIST: 1 patents #595 of 1,741Top 35%
Overall (2017): #377,001 of 506,227Top 75%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9581617 Apparatus for scanning nano structure with plural AFM probes and method thereof Donghyeon Son 2017-02-28