Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9832365 | Autofocus based on differential measurements | — | 2017-11-28 |
| 9684159 | Scanning microscope | Erik Martinus Hubertus Petrus Van Dijk, Cornelius Antonius Hezemans, Henricus R. M. Verberne | 2017-06-20 |
| 9578227 | Determining a polar error signal of a focus position of an autofocus imaging system | — | 2017-02-21 |