Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9734987 | Method and system for adaptively scanning a sample during electron beam inspection | Gary Fan, David Chen, Hong Xiao | 2017-08-15 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9734987 | Method and system for adaptively scanning a sample during electron beam inspection | Gary Fan, David Chen, Hong Xiao | 2017-08-15 |