Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9535010 | Defect sampling for electron beam review based on defect attributes from optical inspection and optical review | Somit Joshi | 2017-01-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9535010 | Defect sampling for electron beam review based on defect attributes from optical inspection and optical review | Somit Joshi | 2017-01-03 |