Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9645093 | System and method for apodization in a semiconductor device inspection system | Gary Janik, Steve Cui, Rex Runyon, Dieter Wilk, Steve Short +8 more | 2017-05-09 |
| 9546962 | Multi-spot scanning collection optics | Ralph Johnson, Evegeny Churin, Wenjian Cai, Yong-Mo Moon | 2017-01-17 |