Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9766292 | Abnormality diagnostic device and abnormality diagnostic method for MOSFET switch element | Shinji Hirose, Mamoru Kuraishi, Tomoyuki Ito, Kazuhiro NIIMURA, Kenji Nishigaki +2 more | 2017-09-19 |