Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9741531 | Charged particle beam device enabling facilitated EBSD detector analysis of desired position and control method thereof | Kazuyuki Takeda, Tohru Ando | 2017-08-22 |
| 9607305 | Inspection apparatus | Takahisa Nakano | 2017-03-28 |