YK

Yuji Kohno

JE Jeol: 3 patents #1 of 36Top 3%
Overall (2017): #52,756 of 506,227Top 15%
3
Patents 2017

Issued Patents 2017

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
9779911 Electron microscope and method of measuring aberrations — 2017-10-03
9728372 Measurement method and electron microscope — 2017-08-08
9576768 Multipole lens and charged particle beam system — 2017-02-21