YW

You-Jin Wang

HM Hermes Microvision: 1 patents #9 of 21Top 45%
Overall (2017): #184,648 of 506,227Top 40%
1
Patents 2017

Issued Patents 2017

Patent #TitleCo-InventorsDate
9572237 Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask Chiyan Kuan, Chung-Shih Pan 2017-02-14