Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9733272 | Designed asperity contactors, including nanospikes, for semiconductor test using a package, and associated systems and methods | Douglas A. Preston | 2017-08-15 |
| 9612259 | Wafer testing system and associated methods of use and manufacture | Aaron Durbin, David William Keith | 2017-04-04 |
| 9612278 | Wafer prober integrated with full-wafer contacter | — | 2017-04-04 |