Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9846934 | Pattern weakness and strength detection and tracking during a semiconductor device fabrication process | Chenmin Hu, Ye Chen, Yue Ma, Chingyun Hsiang, Justin Chen +3 more | 2017-12-19 |