Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9823273 | Probe tip formation for die sort and test | Kip P. Stevenson, Kamil Salloum, Todd P. Albertson | 2017-11-21 |
| 9535095 | Anti-rotation for wire probes in a probe head of a die tester | David Shia, Todd P. Albertson | 2017-01-03 |