Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9846934 | Pattern weakness and strength detection and tracking during a semiconductor device fabrication process | Khurram Zafar, Chenmin Hu, Ye Chen, Yue Ma, Chingyun Hsiang +3 more | 2017-12-19 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9846934 | Pattern weakness and strength detection and tracking during a semiconductor device fabrication process | Khurram Zafar, Chenmin Hu, Ye Chen, Yue Ma, Chingyun Hsiang +3 more | 2017-12-19 |