Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9564379 | Via chains for defect localization | Balasingham Bahierathan, Christopher B. D'Aleo, Muthukumaraamy Karthikeyan, Shenzhi Yang | 2017-02-07 |
GJ
Gregory M. Johnson
Stmicroelectronics Sa: 1 patents #48 of 135Top 40%
Overall (2017): #412,906 of 506,227Top 85%
1
Patents 2017