DG

Duncan Gurley

AD Advantest: 1 patents #26 of 116Top 25%
Overall (2017): #435,304 of 506,227Top 90%
1
Patents 2017

Issued Patents 2017

Patent #TitleCo-InventorsDate
9632109 Methods, apparatus, and systems for contacting semiconductor dies that are electrically coupled to test access interface positioned in scribe lines of a wafer Larry John Dibattista 2017-04-25