Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9646425 | Inspection program editing environment with editing environment automatically globally responsive to editing operations in any of its portions | Eric Yeh-Wei Tseo | 2017-05-09 |
| 9639083 | System and method for programming workpiece feature inspection operations for a coordinate measuring machine | Eric Yeh-Wei Tseo | 2017-05-02 |