CK

Chiyan Kuan

HM Hermes Microvision: 1 patents #9 of 21Top 45%
Overall (2017): #463,463 of 506,227Top 95%
1
Patents 2017

Issued Patents 2017

Patent #TitleCo-InventorsDate
9572237 Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask You-Jin Wang, Chung-Shih Pan 2017-02-14